| Record Identifier: | 2444 |
| Class: | .M52 2001 TK 7871 |
| Title: | Microelectronic failure analysis: Instrumentation, science, materials and applications |
| Subject: | Electronics--Materials--Testing--Handbooks, manuals, etc |
| Subject: | Microelectronics--Materials--Testing--Handbooks, manuals, etc |
| Subject: | Microelectronics--Materials--Defects--Handbooks, manuals, etc |
| Subject: | Electronic apparatus and appliances--Testing--Handbooks, manuals, etc |
| Subject: | Semiconductors--Defects--Handbooks, manuals, etc |
| Publisher: | Materials Park, OH,2001,ASM International |
| Publish place: | Materials Park, OH |
| Publisher: | ASM International |
| Publish Date: | 2001 |
| شماره ثبت | نسخه | جلد | بخش | مرجع | شماره بازیابی | در دست امانت | تاریخ بازگشت | ملاحظات | |
|---|---|---|---|---|---|---|---|---|---|
| 1665 | 1 | 0 |