| Record Identifier: | 1979 |
| Class: | .S93,S87 2002 QC 176.84 |
| Title: | Surface and thin film analysis: principles, instrumentation, applications |
| Subject: | Thin films--Surfaces--Analysis |
| Subject: | Electron spectroscopy |
| Subject: | Spectrum analysis |
| Publisher: | Weinheim,2002,Wiley |
| Publish place: | Weinheim |
| Publisher: | Wiley |
| Publish Date: | 2002 |
| شماره ثبت | نسخه | جلد | بخش | مرجع | شماره بازیابی | در دست امانت | تاریخ بازگشت | ملاحظات | |
|---|---|---|---|---|---|---|---|---|---|
| 1718 | 2 | 0 | |||||||
| 1479 | 1 | 0 |