X-ray characterization of materials [Latin Book]
| Record Identifier: | 1623 |
| Class: | .X69 1999 TA 417.25 |
| Title: | X-ray characterization of materials |
| Subject: | Materials--Analysis |
| Subject: | Surfaces(Technology) --Analysis |
| Subject: | X-ray--Industrial applications |
| Publisher: | Weinheim,1999,Wiley-VCH |
| Publish place: | Weinheim |
| Publisher: | Wiley-VCH |
| Publish Date: | 1999 |
| Register Number | Version | Volume | Part | Reference | Call Number | lended | Date Back | Description | |
|---|---|---|---|---|---|---|---|---|---|
| 1153 | 1 | 0 |
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